Effects of Spatial Pattern Scale of Brain Activity on the Sensitivity of DOT, fMRI, EEG and MEG

Open Access

Peer-reviewed

Research Article

Katherine L. Perdue ,

* E-mail: Katherine.Perdue@childrens.harvard.edu

Affiliation Thayer School of Engineering at Dartmouth, Hanover, New Hampshire, United States of America
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Solomon Gilbert Diamond

Affiliation Thayer School of Engineering at Dartmouth, Hanover, New Hampshire, United States of America
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Electroencephalography
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Functional magnetic resonance imaging
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Neuroimaging
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Magnetometers
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Imaging techniques
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Magnetoencephalography
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Head
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Network analysis
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