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Next Generation MUT-MAP, a High-Sensitivity High-Throughput Microfluidics Chip-Based Mutation Analysis Panel
Schleifman EB,
Tam R,
Patel R,
Tsan A,
Sumiyoshi T,
et al.
(2014)
Next Generation MUT-MAP, a High-Sensitivity High-Throughput Microfluidics Chip-Based Mutation Analysis Panel.
PLOS ONE 9(3): e90761.
https://doi.org/10.1371/journal.pone.0090761